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What: Design Automation and Test in Europe (DATE) When: March 6, 2006 Where: ICM, Messe Munich, Germany Title: DFM Tools and Methodologies for 65nm and Below Organizer: Andrew B Kahng, UC San Diego and Blaze DFM Additional This tutorial will present a view of key tool technologies and methodologies that are likely to become main stream for the 65nm node and beyond. Sample topics include parametric yield optimizations for timing, power and reliability, and manufacturing simulations and analyses for shape (litho and etch). DATE has become a well known global event with speakers coming from all five continents and more than 45 countries. DATE features a technical program with 78 sessions covering the latest in system design and embedded software, IC design methodologies and EDA tool developments. DATE also features an exhibition with the leading EDA, silicon and IP Providers showing new products and services. Andrew B. Kahng, Ph.D., is co-founder, chairman and CTO, Blaze DFM Inc. Kahng is currently on leave from his position as Professor of Computer Science and Engineering, and Professor of Electrical and Computer Engineering at the University of California, San Diego
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